-A A +A
Type: 
Journal
Description: 
Microscopic understanding the metal-to-insulator transition (MIT) in strongly correlated materials is critical to the design and control of modern “beyond silicon” Mott nanodevices. In this work, the local MIT behaviors in single crystalline V2O3 thin films were probed on an atomic scale by online 57Fe emission Mössbauer spectroscopy (eMS) following dilute (
Publisher: 
Elsevier
Publication date: 
6 Oct 2020
Authors: 

B Qi, HP Gunnlaugsson, S Ólafsson, HP Gislason, EB Thorsteinsson, UB Arnalds, R Mantovan, I Unzueta, DV Zyabkin, K Bharuth Ram, K Johnston, PB Krastev, TE Mølholt, H Masenda, A Tarazaga Martín-Luengo, D Naidoo, J Schell

Biblio References: 
Pages: 138389
Origin: 
Thin Solid Films