Conferences | Agrate UNIT

Reliability of NiO-based resistive switching memory (ReRAM) elements with pillar W bottom electrode

A Demolliens, Ch Muller, D Deleruyelle, S Spiga, E Cianci, M Fanciulli, Federico Nardi, Carlo Cagli, Daniele Ielmini

2009-05-10

Biblio references: Pages: 1-3

Origin: 2009 IEEE International Memory Workshop

Detrimental impact of technological processes on BTI reliability of advanced high-k/metal gate stacks

X Garros, M Casse, C Fenouillet-Beranger, G Reimbold, F Martin, C Gaumer, C Wiemer, M Perego, F Boulanger

2009-04-26

Biblio references: Pages: 362-366

Origin: 2009 IEEE International Reliability Physics Symposium

Sample variability and time stability in scaled silicon nanowires

M Pierre, X Jehl, R Wacquez, M Vinet, M Sanquer, M Belli, E Prati, M Fanciulli, J Verduijn, GC Tettamanzi, GP Lansbergen, S Rogge, M Ruoff, M Fleischer, D Wharam, D Kern

2009-03-18

Biblio references: Pages: 249-252

Origin: 2009 10th International Conference on Ultimate Integration of Silicon

Developing a miniaturized continuous flow electrochemical cell for biosensor applications

Mihaela Ilie, E Ovreiu, R Dejana, V Foglietti, L Nardi, A Masci, B Lanza, L Della Seta, MR Montereali, W Vastarella, R Pilloton

2009-01-07

Biblio references: Volume: 7297 Pages: 729724

Origin: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV

Temperature and dose dependence of defect complex formation with ion implanted Mn/Fe in ZnO

Torben Esmann, R Mantovan, Haraldur Pall Gunnlaugsson

2009-01-01

Biblio references:

Origin: 25th International Conference on Defects on Semiconductors

Read-disturb limited reliability of multilevel NiO-based resistive-switching memory

DANIELE IELMINI, FEDERICO NARDI, A Vigani, E Cianci, S Spiga

2009-01-01

Biblio references: Pages: 6.3-1-6.3-2

Origin: IEEE Semiconductor Interface Specialist Conference

On-chip nano-manipulation of single magnetic particles via domain walls conduits for cell or molecule handling

M Donolato, P Vavassori, M Gobbi, V Metlushko, B Ilic, S Brivio, D Petti, R Bertacco

2009-01-01

Biblio references:

Origin: 13th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2009

2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009

FA Bovino, M Giardina, Maria Cristina Larciprete, A Belardini, Marco Centini, Concetta Sibilia, M Bertolotti, A Passaseo, V Tasco

2009-01-01

Biblio references:

Origin: 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009

Near-field investigation of plasmon efefcts in self-organized Gold nanowire samples

FRANCESCO TANTUSSI, C Martella, K Subramanian, FRANCESCO FUSO, MARIA ALLEGRINI, A Toma, D Chiappe, F Buatier de Mongeot

2009-01-01

Biblio references:

Origin: Fourth International Conference on Surface Plasmon Photonics (SPP4)

Oxidation behaviour and thermal stability of nanocomposited Ti-Al-Si-BN and Ti-Cr-BN coatings

A Fabrizi, C Paternoster, R Cecchini, Ph V Kiryukhantsev-Korneev, A Sheveyko, Marcello Cabibbo, Marie Haidopoulo, S Spigarelli

2009-01-01

Biblio references: Volume: 604 Pages: 19-28

Origin: Materials Science Forum

Reliability of NiO-based resistive switching memory (ReRAM) elements with pillar W bottom electrode

Detrimental impact of technological processes on BTI reliability of advanced high-k/metal gate stacks

Sample variability and time stability in scaled silicon nanowires

Developing a miniaturized continuous flow electrochemical cell for biosensor applications

Temperature and dose dependence of defect complex formation with ion implanted Mn/Fe in ZnO

Read-disturb limited reliability of multilevel NiO-based resistive-switching memory

On-chip nano-manipulation of single magnetic particles via domain walls conduits for cell or molecule handling

2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009

Near-field investigation of plasmon efefcts in self-organized Gold nanowire samples

Oxidation behaviour and thermal stability of nanocomposited Ti-Al-Si-BN and Ti-Cr-BN coatings

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Units in Italy

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