WS Zhao, Y Zhang, HP Trinh, JO Klein, C Chappert, R Mantovan, A Lamperti, RP Cowburn, T Trypiniotis, M Klaui, J Heinen, B Ocker, D Ravelosona
Biblio references: Pages: 1-4
Origin: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology
Celia Castro, A Andreozzi, Gérard Benassayag, Ana Beltran, G Seguini, M Perego, Sylvie Schamm-Chardon
Biblio references:
Origin: Proceeding of the 15th European Microscopy Conference
Castro Celia, A Andreozzi, Gérard Benassayag, Ana Beltran, G Seguini, M Perego, Sylvie Schamm-Chardon
Marco Fanciulli, Matteo Belli, Antonio Vellei, Carmen Canevali, Davide Rotta, Stefano Paleari, Martina Basini
Biblio references: Volume: 1 Pages: 24003
Origin: APS Meeting Abstracts
Alberto Debernardi, Guido Petretto, Andrea Masse, Marco Fanciulli
Marco Fanciulli, Silvia Baldovino, Alessandro Molle
Origin: APS March Meeting Abstracts
E Prati, G Petretto, M Belli, G Mazzeo, S Cocco, M De Michielis, M Fanciulli, F Guagliardo, M Vinet, R Wacquez
Biblio references: Volume: 1 Pages: 14010
PG Gucciardi, B Fazio, C D’Andrea, F Bonaccorso, A Irrera, G Calogero, C Vasi, Maria Allegrini, A Toma, D Chiappe, C Martella, F Buatier de Mongeot
Origin: BIT's 1st Annual Conference and EXPO of AnalytiX-2012
Lars Martin S Aas, Ingar Stian Nerbø, Morten Kildemo, Daniele Chiappe, Christian Martella, Francesco Buatier De Mongeot
Biblio references: Volume: 8082 Pages: 80822W
Origin: Optical Measurement Systems for Industrial Inspection VII
Federico Nardi, Carlo Cagli, D Ielmini, S Spiga
Origin: 2011 3rd IEEE International Memory Workshop (IMW)
