Conferences | Agrate UNIT

Magnetic resonance characterization of silicon nanowires

Marco Fanciulli, Matteo Belli, Antonio Vellei, Carmen Canevali, Davide Rotta, Stefano Paleari, Martina Basini

2012-02-01

Biblio references: Volume: 1 Pages: 24003

Origin: APS Meeting Abstracts

Polarization properties of Surface Enhanced Raman Spectroscopy

PG Gucciardi, B Fazio, C D’Andrea, F Bonaccorso, A Irrera, G Calogero, C Vasi, Maria Allegrini, A Toma, D Chiappe, C Martella, F Buatier de Mongeot

2012-01-01

Biblio references:

Origin: BIT's 1st Annual Conference and EXPO of AnalytiX-2012

Mueller matrix imaging of plasmonic polarizers on nanopatterned surface

Lars Martin S Aas, Ingar Stian Nerbø, Morten Kildemo, Daniele Chiappe, Christian Martella, Francesco Buatier De Mongeot

2011-05-27

Biblio references: Volume: 8082 Pages: 80822W

Origin: Optical Measurement Systems for Industrial Inspection VII

Nonlinear circular dichroism in self-organized metal nanowires arrays

A Belardini, MC Larciprete, M Centini, E Fazio, C Sibilia, D Chiappe, C Martella, A Toma, F Buatier de Mongeot

2011-05-22

Biblio references: Pages: EF2_4

Origin: European Quantum Electronics Conference

Reset Current Reduction and Set-Reset Instabilities in Unipolar NiO RRAM

FEDERICO Nardi, CARLO Cagli, D Ielmini, S Spiga

2011-05-22

Biblio references: Pages: 1-4

Origin: 2011 3rd IEEE International Memory Workshop (IMW)

Self-organised Au nanowire arrays with strongly polarised SERS activity

C Martella, D Chiappe, M Giordano, A Toma, F Buatier de Mongeot, MARIA ALLEGRINI, B Fazio, PG Gucciardi, C D’Andrea, A Irrera, F Bonaccorso, G Calogero, C Vasi

2011-01-01

Biblio references:

Origin: Int. Workshop Nanoscale Pattern Formation at Surfaces

Comparison of semiclassical transport formulations including quantum corrections for advanced devices with high-K gate stacks

FM Bufler, V Aubry-Fortuna, A Bournel, M Braccioli, P Dollfus, David Esseni, C Fiegna, F Gamiz, Marco De Michielis, Pierpaolo Palestri, J Saint-Martin, C Sampedro, E Sangiorgi, Luca Selmi, Paolo Toniutti

2010-10-26

Biblio references: Pages: 1-4

Origin: 2010 14th International Workshop on Computational Electronics

Surface Plasmon “Hot Spots” Detected By Near-field Polarization Spectroscopy

FRANCESCO Tantussi, V Clericò, C Martella, Vasanthakumar Priya, FRANCESCO Fuso, MARIA Allegrini, A Toma, D Chiappe, C Boragno, F Buatier de Mongeot

2010-10-24

Biblio references: Pages: PDPB3

Origin: Frontiers in Optics

Experimental and simulation study of the program efficiency of HfO 2 based charge trapping memories

Sabina Spiga, Gabriele Congedo, Ugo Russo, Alessio Lamperti, Olivier Salicio, Francesco Driussi, Elisa Vianello

2010-09-14

Biblio references: Pages: 408-411

Origin: 2010 Proceedings of the European Solid State Device Research Conference

Sub-10 µA reset in NiO-based resistive switching memory (RRAM) cells

F Nardi, D Ielmini, C Cagli, S Spiga, M Fanciulli, L Goux, DJ Wouters

2010-05-16

Biblio references: Pages: 1-4

Origin: 2010 IEEE International Memory Workshop

Magnetic resonance characterization of silicon nanowires

Polarization properties of Surface Enhanced Raman Spectroscopy

Mueller matrix imaging of plasmonic polarizers on nanopatterned surface

Nonlinear circular dichroism in self-organized metal nanowires arrays

Reset Current Reduction and Set-Reset Instabilities in Unipolar NiO RRAM

Self-organised Au nanowire arrays with strongly polarised SERS activity

Comparison of semiclassical transport formulations including quantum corrections for advanced devices with high-K gate stacks

Surface Plasmon “Hot Spots” Detected By Near-field Polarization Spectroscopy

Experimental and simulation study of the program efficiency of HfO 2 based charge trapping memories

Sub-10 µA reset in NiO-based resistive switching memory (RRAM) cells

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Scientific Productions

Units in Italy

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