Sabina Spiga, Claudia Wiemer, Giovanna Scarel, Omar Costa, Marco Fanciulli
Biblio references: Pages: 203-223
Origin: Rare Earth Oxide Thin Films
Sylvie Schamm, Giovanna Scarel, Marco Fanciulli
Biblio references: Pages: 153-177
Origin: Rare earth oxide thin films
S Spiga, C Wiemer, G Scarel, G Seguini, M Fanciulli, A Zenkevich, Yu Lebedinskii
Biblio references: Pages: 181-209
Origin: Advanced Gate Stacks for High-Mobility Semiconductors
Giovanna Scarel, Axel Svane, Marco Fanciulli
Biblio references: Pages: 1-14
Origin: Rare Earth oxide thin films
Gabriele Seguini, Michele Perego, Marco Fanciulli
Biblio references: Pages: 269-283
ANDREI ZENKEVICH, YURI LEBEDINSKII, GIOVANNA SCAREL, MARCO FANCIULLI
Biblio references: Pages: 147-160
Origin: Defects in High-k Gate Dielectric Stacks
R Mantovan, C Wiemer, A Zenkevich, M Fanciulli
Biblio references: Pages: 1349-1353
Origin: ICAME 2005
Biblio references:
Yuri Lebedinskii, Andrei Zenkevich, Giovanna Scarel, Marco Fanciulli
Biblio references: Pages: 127-142
Elena Cianci, Vittorio Foglietti, Antonio Minotti, Alessandro Caronti, Gino Caliano, Massimo Pappalardo
Biblio references: Pages: 353-382
Origin: MEMS/NEMS
