J MALY, M ILIE, E CIANCI, V FOGLIETTI, L DELLA SETA, MR MONTEREALI, K PUNAKIVI, W VASTARELLA, R PILLOTON
Biblio references: Pages: 35-40
Origin: Sensors And Microsystems
K Bharuth-Ram, HP Gunnlaugsson, R Mantovan, VV Naicker, D Naidoo, R Sielemann, G Weyer, Th Aigne, ISOLDE Collaboration
Biblio references: Pages: 621-625
Origin: ICAME 2007
W Vastarella, M ILIE, L NARDI, A MASCI, R PILLOTON, E Cianci, S QUARESIMA, A COPPA, V FOGLIETTI
Biblio references: Pages: 312-316
Sylvie Schamm, Giovanna Scarel, Marco Fanciulli
Biblio references: Pages: 153-177
Origin: Rare earth oxide thin films
Sabina Spiga, Claudia Wiemer, Giovanna Scarel, Omar Costa, Marco Fanciulli
Biblio references: Pages: 203-223
Origin: Rare Earth Oxide Thin Films
S Spiga, C Wiemer, G Scarel, G Seguini, M Fanciulli, A Zenkevich, Yu Lebedinskii
Biblio references: Pages: 181-209
Origin: Advanced Gate Stacks for High-Mobility Semiconductors
Giovanna Scarel, Axel Svane, Marco Fanciulli
Biblio references: Pages: 1-14
Origin: Rare Earth oxide thin films
Gabriele Seguini, Michele Perego, Marco Fanciulli
Biblio references: Pages: 269-283
Elena Cianci, Vittorio Foglietti, Antonio Minotti, Alessandro Caronti, Gino Caliano, Massimo Pappalardo
Biblio references: Pages: 353-382
Origin: MEMS/NEMS
MARCO FANCIULLI, OMAR COSTA, SILVIA BALDOVINO, SIMONE COCCO, GABRIELE SEGUINI, ENRICO PRATI, GIOVANNA SCAREL
Biblio references: Pages: 263-276
Origin: Defects in High-k Gate Dielectric Stacks
